Electroglas
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The Electroglas 1034 is a semiconductor prober. A prober is a type of automated test equipment used to make electrical contact with individual die on a semiconductor wafer before the wafer is diced. The Electroglas 1034 is a specific model of prober manufactured by Electroglas, a company known for producing wafer probers used in the semiconductor industry.
A prober positions a wafer on a chuck and aligns it under a set of probe needles or a probe card. The probe card contacts the bond pads on each die, enabling electrical testing, parametric measurement, and functional test of the circuits.
Probers typically include a precision stage for moving the wafer in X, Y, and Z axes, a chuck for holding the wafer, and a microscope or camera system for optical alignment. The Electroglas 1034, as a prober, uses these core subsystems to perform its testing function.
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The following facts about the 1034 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No specifications for the 1034 are on record.
Answerable by: an OEM datasheet, a cleanroom equipment inventory, or an engineer who operated or installed it
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 1034 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the 1034 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the 1034 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the 1034 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
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Last updated Aug 14, 2026.
The Signatone 1160 is a probe station microscope for viewing samples and parametric probing of devices.