Comparison ledger
Electroglas 1034, Mahr MMQ 40 Form, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1034Electroglas | MMQ 40 FormMahr |
|---|---|---|
| OEM | Electroglas | Mahr |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Electroglas 1034 | Mahr MMQ 40 Form |
| Specifications | ||
| Configuration | — | High precision sphere for accuracy[1] |
| OEM | — | Mahr[1] |
| Model | — | MMQ 40[1] |
| Equipment type | — | Form tester[1] |
| High precision sphere | — | 50 mm[1] |
| Circular deviation | — | 0.00004 mm[1] |
| Probe compatibility | — | MFU / MMR / MMQ[1] |
| Adjustable angle | — | 110 degrees[1] |
| Adjustable measuring force | — | 0.5 to 0.005 N[1] |
| Type | — | MMQ 40[2] |
| Workpiece diameter | — | up to 350 mm[2] |
| Workpiece length | — | up to 450 mm[2] |
| Control | — | CNC-controlled[2] |
| Evaluation system | — | Form PC[2] |
| Included peripherals | — | TFT monitor, keyboard, mouse, printer[2] |
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