Comparison ledger
Electroglas 2001 CX, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 2001 CXElectroglas | |
|---|---|---|
| OEM | Electroglas | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Electroglas EG 2001 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | Single channel[1] | — |
| Make | Electroglas[1] | — |
| Model | 2001 CX[1] | JR-A-F4T[4] |
| Wafer Size | 6 inch[1] | — |
| Category | Prober[1] | — |
| Channel Configuration | Single channel[1] | — |
| Equipment Type | Automatic wafer prober[1] | — |
| Maximum Wafer Size | 6 inch[2] | — |
| X-Y Stage Positioning | Linear motor on air bearing[3] | — |
| Vision System | Advanced vision processing for automatic alignment[3] | — |
| Vertical Motion Bearing Options | Sleeve bearing, air bearing, or ball bearing[3] | — |
| Chamber Size | — | 1.2 cubic feet[4] |
| Temperature Range | — | -68°C to +180°C[4] |
| Control | — | +/-1.0°C[4] |
| Manufacturer | — | Tenney[4] |
| Short description | — | Junior compact temperature test chambers[4] |
| Control accuracy | — | +/-1.0°C[4] |
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