Comparison ledger
Electroglas EG 2001 X Automatic Wafer, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | EG 2001 X Automatic WaferElectroglas | 1007KLA |
|---|---|---|
| OEM | Electroglas | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Electroglas EG 2001 | KLA 1007 |
| Specifications | ||
| Configuration | With mapping capabilities[1] | — |
| Model | EG 2001 X[1] | 1007[4] |
| Equipment type | Automatic Wafer Prober[1] | Prober[5] |
| Capability | With mapping capabilities[1] | — |
| Category | Test & Probe[2] | — |
| Wafer sizes | 6 inch / 150 mm; 8 inch / 200 mm[3] | — |
| Manufacturer | — | KLA[4] |
| Description | — | Wafer Prober[4] |
| Wafer size | — | 150 mm[4] |
| Convertible to 8 inch wafer size | — | Yes[4] |
| Vintage | — | 01.06.1995[4] |
| Make | — | KLA[5] |
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