Waferpedia

Comparison ledger

F10-RT-UVX versus R50

Filmetrics F10-RT-UVX and Filmetrics R50, side by side. Every value shown is drawn from its cited encyclopedia entry.

Side-by-side comparison of selected equipment models
Attribute
F10-RT-UVXFilmetrics
R50Filmetrics
OEMFilmetricsFilmetrics
CategoryMetrology & InspectionMetrology & Inspection
Wafer size200mm
Process node
Introduced
Production run
Lifecycle
Lifecycle milestones
Control system
Generation
FamilyFilmetrics F10-RT-UVXFilmetrics R50
Specifications
FunctionReflection/Transmission Spectra & Optical Film Thickness[1]
ModelF10-RT-UVX[1]
OEMFilmetrics[1]
Default configurationconfigured by default for metallic layers[2]
Default sample thickness525 um +/- 25 um[2]
Equipment sectionMetrology[2]
Related equipment on same page groupAIT CMT-SR2000N 4-Point Probe Measurement System; MPI TS150 Probe Station[2]

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Sources (2)Every fact above is drawn from these public sources
  1. [1]wiki.nanotech.ucsb.eduwiki.nanotech.ucsb.edu
  2. [2]epfl.chepfl.ch