Comparison ledger
Keysight 4072 A Parametric, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 4072 A ParametricKeysight | |
|---|---|---|
| OEM | Keysight | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Keysight 4072 A Parametric | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Wafer size | 8 inch[1] | — |
| SMU support | up to 2 HPSMU, up to 2 HRSMU, up to 8 total SMUs[2] | — |
| Switching matrix | low-leakage, customizable from 12 to 48 fully-guarded Kelvin outputs[2] | — |
| High-frequency switching matrix | integrated pulse generator control[2] | — |
| Auxiliary inputs / Extended path inputs | 8 auxiliary inputs, 48 extended path inputs[2] | — |
| HRSMU measurement resolution | 2 µV, 1 fA[2] | — |
| HPSMU output capability | ±200 V, ±1 A[2] | — |
| Capacitance frequency range | 1 kHz to 2 MHz[2] | — |
| Ground unit current | ±1.6 A[2] | — |
| HV-SPGU output voltage | ±40 V (80 V p-p) at high impedance[2] | — |
| HV-SPGU pulse rise/fall time | as fast as 20 ns[2] | — |
| HV-SPGU three-level output pulse | provides three-level output pulse capability[2] | — |
| HV-SPGU arbitrary linear waveform generation | ALWG function[2] | — |
| Manufacturer | Keysight / Agilent[1] | Tenney[3] |
| Model | 4072 A[1] | JR-A-F4T[3] |
| Equipment type | Parametric tester[1] | — |
| Alternate designation | Agilent 4072A Advance Parametric Tester[2] | — |
| Chamber Size | — | 1.2 cubic feet[3] |
| Temperature Range | — | -68°C to +180°C[3] |
| Control | — | +/-1.0°C[3] |
| Short description | — | Junior compact temperature test chambers[3] |
| Control accuracy | — | +/-1.0°C[3] |
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