Comparison ledger
Keysight 4145 B Semiconductor Parameter Analyzer, Rorze 03 RR 8120-001-001 Wafer Exchanger, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | ||
|---|---|---|
| OEM | Keysight | Rorze |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Keysight 41xx | Rorze 03 RR 8120-001-001 Wafer Exchanger |
| Specifications | ||
| Configuration | Fully automatic, high-speed dc characterization of semiconductor devices[1] | — |
| Manufacturer | Keysight / Agilent[1] | Rorze[4] |
| Model | 4145 B[1] | 03 RR 8120-001-001[4] |
| Instrument type | Semiconductor Parameter Analyzer[1] | — |
| Mode | Fully automatic[1] | — |
| Function | High-speed DC characterization of semiconductor devices[1] | — |
| Sourcing and measurement | High resolution, wide range sourcing and measurement[2] | — |
| Measurement and display points | Maximum 1150[1] | — |
| Analysis functions | Flexible graphic analysis functions for quick parameter extraction[1] | — |
| Storage / drive | Built-in micro flexible disc drive[1] | — |
| Sourcing and measurement range | 50 fA to 100 mA and 1 mV to 100 V[3] | — |
| Program storage | Floppy disk drive stores 240 user programs or 105 measurement results[3] | — |
| Family | Keysight 41xx family[2] | — |
| Wafer size | — | 8 inch[4] |
| Equipment type | — | Wafer Exchanger[4] |
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