Comparison ledger
Keysight B 2902 A Precision Source Measure, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | |
|---|---|---|
| OEM | Keysight | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Keysight B 2902 A Precision Source Measure | KLA 1007 |
| Specifications | ||
| Configuration | 2 Channel[1] | — |
| Manufacturer | Keysight[1] | KLA[4] |
| Model | B 2902 A[1] | 1007[4] |
| Instrument type | precision source measure instrument[2] | — |
| Channel count | 2 channel[1] | — |
| Series | B2900A Series Precision Source/Measure Unit[3] | — |
| Voltage source range | ±210 V[3] | — |
| Current source range | ±3 A DC and ±10.5 A pulsed[3] | — |
| Voltage source resolution | 100 nV[3] | — |
| Current source resolution | 100 fA[3] | — |
| Voltage measurement resolution | 100 nV[3] | — |
| Current measurement resolution | 100 fA[3] | — |
| Sampling rate | 20 μs (50,000 points/s)[3] | — |
| Display | 4.3 inch color LCD display[3] | — |
| Interfaces | USB2.0, LAN, GPIB and digital I/O[3] | — |
| Description | — | Wafer Prober[4] |
| Wafer size | — | 150 mm[4] |
| Convertible to 8 inch wafer size | — | Yes[4] |
| Vintage | — | 01.06.1995[4] |
| Make | — | KLA[5] |
| Equipment type | — | Prober[5] |
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