Comparison ledger
KLA 1007, Tektronix TDS 784 D Digital Oscilloscope, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | TDS 784 D Digital OscilloscopeTektronix |
|---|---|---|
| OEM | KLA | Tektronix |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | Tektronix TDS 784 |
| Cited variants | — |
|
| Specifications | ||
| Manufacturer | KLA[2] | — |
| Model | 1007[2] | — |
| Description | Wafer Prober[2] | — |
| Wafer size | 150 mm[2] | — |
| Convertible to 8 inch wafer size | Yes[2] | — |
| Vintage | 01.06.1995[2] | — |
| Make | KLA[3] | — |
| Equipment type | Prober[3] | — |
| Configuration | — | 4 channel[4] |
| Type | — | Digital phosphor oscilloscope[1] |
| Channels | — | 4[1] |
| Bandwidth | — | 1 GHz[1] |
| Sample rate | — | up to 4 GS/s[1] |
| Maximum waveform capture rate | — | 200,000[1] |
| Vertical accuracy | — | 1%[1] |
| Vertical resolution | — | 8-bit; over 11 bits with averaging and over 13 bits with hi-res[1] |
| Peak detect | — | 1 ns[1] |
| Sensitivity | — | 1 mV/div to 10 V/div[1] |
| Record length | — | up to 8 M points[1] |
| Storage | — | Floppy disk storage; Iomega Zip and Zip Plus drive compatible[1] |
| GPIB | — | Full GPIB programmability[1] |
| Warranty | — | 3 year warranty[1] |
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