Comparison ledger
KLA 1007, Teradyne Spectrum 8862, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | Spectrum 8862Teradyne |
|---|---|---|
| OEM | KLA | Teradyne |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | Teradyne Spectrum 8862 |
| Specifications | ||
| Manufacturer | KLA[1] | — |
| Model | 1007[1] | — |
| Description | Wafer Prober[1] | — |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | — |
| Make | KLA[2] | — |
| Equipment type | Prober[2] | — |
| Type | — | Combinational in-circuit (ICT) / functional test system[3] |
| System type | — | Combinational in-circuit (ICT)/functional test system[3] |
| Product category | — | Test Equipment[3] |
| Test capability | — | Combinational ICT/functional test system[3] |
| Use case | — | Combines functional and ICT test capabilities on a single system[3] |
| Purpose | — | Combines functional and ICT test capabilities on a single system[3] |
| Intended use | — | Combine functional and ICT test capabilities on a single system[3] |
| Product type | — | In-Circuit Test System[3] |
| Test capabilities | — | Combinational ICT/functional test system[3] |
| Test system type | — | Combinational in-circuit (ICT)/functional test system[3] |
| Alternate designation | — | TSSE[3] |
| Positioning | — | Unique combinational ICT/functional test system[3] |
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