Comparison ledger
KLA .204 PSL Wafer and KLA Prometrix UV 1250 SE Film Thickness Measurement, side by side. Every value shown is drawn from its cited encyclopedia entry.
| Attribute | ||
|---|---|---|
| OEM | KLA | KLA |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA .204 PSL Wafer | KLA UV 1250 SE |
| Specifications | ||
| Configuration | NIST Traceable[1] | 120 Volt[2] |
| Wafer Size | 8 inch[1] | — |
| Traceability | NIST[1] | — |
| Compatible Tools | Surfscan 6xy0, Sp1[1] | — |
| Phase | — | 1 Phase[2] |
| Software Version | — | 2.4[2] |
| Robot Type | — | KLA H2D[2] |
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