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Comparison ledger

.204 PSL Waferversus1450 VPSE

KLA .204 PSL Wafer, LEO 1450 VPSE, side by side. Every value shown is drawn from the cited encyclopedia entries.

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Side-by-side comparison of selected equipment models
Attribute
OEMKLALEO
CategoryMetrology & InspectionMetrology & Inspection
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyKLA .204 PSL WaferLEO 1450 VPSE
Specifications
ConfigurationNIST Traceable[1]Variable Pressure SEM Platform[4]
Wafer Size8 inch[2]—
TraceabilityNIST[3]—
Compatible ToolsSurfscan 6xy0, Sp1[1]—
NIST TraceableYes[2]—
Compatible toolsSurfscan 6xy0 and Sp1 particle counters[2]—
X-ray Micro Analysis—Mounted EDAX EDS Microanalysis Detector Tower[4]
Compositional Imaging—KE Development Type 200 Four-Quadrant Backscattered Electro (BSE) Detector system with manual insertion control rod[4]
Electron source—Tungsten hairpin filament (standard)[5]
Accelerating voltage—0.2 kV to 30 kV[5]
Resolution (high vacuum)—3.5 nm at 30 kV[5]
Variable pressure range—1 Pa to 400 Pa[5]
Magnification—9x to 900,000x[5]
Probe current—1 pA to (Optibeam controlled)[5]
Detectors—Everhart Thornley SE detector, Variable Pressure Secondary Electron (VPSE) detector[5]
Chamber dimensions—300 mm x 270 mm x 224 mm[5]
Stage axes—5-axis motorized: X=100mm, Y=125mm, Z=60mm, Tilt 0-90°, Rotation 360°[5]
EDS detector—Mounted EDAX EDS Microanalysis Detector Tower[4]
BSE detector—KE Development Type 200 Four-Quadrant Backscattered Electron Detector system with manual insertion control rod[4]
Active isolation platform—Integrated Kinetic Systems Vibraplane pneumatic active vibration dampening table frame[4]
Control software—SmartSEM column control software on dedicated terminal[4]
Vacuum pump—Floor-mounted Edwards RV mechanical rotary vane roughing/backing vacuum pump[4]
Lens chiller—Standalone closed-loop recirculating liquid laboratory lens chiller[4]
Tool type—Variable-pressure scanning electron microscope (VP-SEM)[6]
Category—Metrology & Inspection[6]
Resolution—3.5 nm at 30 kV[6]
Stage—5-axis motorized; X=100 mm, Y=125 mm, Z=60 mm, Tilt 0-90°, Rotation 360°[6]
X-ray microanalysis—Mounted EDAX EDS microanalysis detector tower[4]

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Sources (6)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]waferpedia.comwaferpedia.com
  3. [3]waferpedia.comwaferpedia.com
  4. [4]inventory listing
  5. [5]espie-electronic.comespie-electronic.com
  6. [6]waferpedia.comwaferpedia.com