Waferpedia

Comparison ledger

.204 PSL WaferversusScientific FEI Nova NanoSEM 430 FE-SEM

KLA .204 PSL Wafer, Thermo Fisher Scientific FEI Nova NanoSEM 430 FE-SEM, side by side. Every value shown is drawn from the cited encyclopedia entries.

Email
Side-by-side comparison of selected equipment models
Attribute
OEMKLAThermo Fisher
CategoryMetrology & InspectionMetrology & Inspection
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyKLA .204 PSL WaferThermo Fisher Scientific FEI Nova NanoSEM
Specifications
ConfigurationNIST Traceable[1]210-240 V[4]
Wafer Size8 inch[2]—
TraceabilityNIST[3]—
Compatible ToolsSurfscan 6xy0, Sp1[1]—
NIST TraceableYes[2]—
Compatible toolsSurfscan 6xy0 and Sp1 particle counters[2]—
Equipment type—Field Emission Scanning Electron Microscope (FE-SEM)[5]
Category—Metrology & Inspection[5]
Manufacturer—Thermo Fisher Scientific / FEI[5]
Model—Nova NanoSEM 430[5]
Supply voltage—210-240 V[5]
Supply frequency—50/60 Hz[5]
Supply current—15 A[5]

Plan your fab

Building a Metrology & Inspection process? Get a complete equipment list.

Open the fab equipment planner →
Sources (5)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]waferpedia.comwaferpedia.com
  3. [3]waferpedia.comwaferpedia.com
  4. [4]inventory listing
  5. [5]waferpedia.comwaferpedia.com