Comparison ledger
KLA .204 PSL Wafer, View Engineering 725, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 725View Engineering | |
|---|---|---|
| OEM | KLA | View Engineering |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | 1986 |
| Production run | — | 1986– |
| Lifecycle | — | Discontinued |
| Lifecycle milestones | — | 1986 Product introduction · 1986 Introduction |
| Control system | — | — |
| Generation | — | — |
| Family | KLA .204 PSL Wafer | View Engineering 725 |
| Specifications | ||
| Configuration | NIST Traceable[1] | — |
| Wafer Size | 8 inch[2] | — |
| Traceability | NIST[3] | — |
| Compatible Tools | Surfscan 6xy0, Sp1[1] | — |
| NIST Traceable | Yes[2] | — |
| Compatible tools | Surfscan 6xy0 and Sp1 particle counters[2] | — |
| Product type | — | Dedicated machine vision system[4] |
| Inspection target | — | QFP (Quad Flat Package) and PLCC (Plastic leaded chip carrier) package inspection[4] |
| Introduction year | — | 1986[4] |
Plan your fab
Building a Metrology & Inspection process? Get a complete equipment list.
Open the fab equipment planner →