Comparison ledger
KLA 2132 Brightfield and KLA 2138, side by side. Every value shown is drawn from its cited encyclopedia entry.
| Attribute | 2138KLA | |
|---|---|---|
| OEM | KLA | KLA |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 21xx | KLA 2138 |
| Specifications | ||
| Configuration | Main body only[1] | — |
| Product name | — | KLA-2138[2] |
| Type | — | Wafer Inspection System[2] |
| Technology | — | Ultra-Broadband Technology[2] |
| Illumination source | — | Ultra-broadband (UBB) illumination source[2] |
| Optics | — | Significantly improved brightfield optics[2] |
| Detection technology | — | Segmented Auto Threshold (SAT) technology[2] |
| Optional configuration | — | Integrated SMIF minienvironment[2] |
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