Comparison ledger
KLA 2138 Brightfield and KLA 5200, side by side. Every value shown is drawn from its cited encyclopedia entry.
| Attribute | 5200KLA | |
|---|---|---|
| OEM | KLA | KLA |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 21xx | KLA 5200 |
| Specifications | ||
| Configuration | 30 A[1] | — |
| Voltage | 208 V, 3 Phase[1] | — |
| Software Version | 5.4.010[1] | — |
| Robot Type | KLA Internal[1] | — |
| Measurement technology | — | Coherence Probe Microscopy (CPM), a patented white-light interferometric technique[2] |
| Targets measured | — | Surfaces, including low-contrast or grainy targets[2] |
| Feature size capability stated | — | Down to 0.18 µm[2] |
| Software | — | Built-in analysis software[2] |
| User interface | — | Graphical user interface[2] |
Plan your fab
Building a Metrology & Inspection process? Get a complete equipment list.
Open the fab equipment planner →