Waferpedia

Comparison ledger

2138 XP versus Surfscan SP 5 Particle Defect

KLA 2138 XP and KLA Surfscan SP 5 Particle Defect, side by side. Every value shown is drawn from its cited encyclopedia entry.

Side-by-side comparison of selected equipment models
Attribute
OEMKLAKLA
CategoryMetrology & InspectionMetrology & Inspection
Wafer sizeBare Wafer Inspection Station
Process node
Introduced
Production run
Lifecycle
Lifecycle milestones
Control system
Generation
FamilyKLA 2138 XPKLA Surfscan
Specifications
ConfigurationIntegrated Console[1]
Wafer sizeBare Wafer Inspection Station[1]

Plan your fab

Building a Metrology & Inspection process? Get a complete equipment list.

Open the fab equipment planner →
Sources (1)Every fact above is drawn from these public sources
  1. [1]inventory listing