Waferpedia

KLA

2138 XP

Metrology & InspectionKLA 2138 XP family
Research Quality: 40% complete

Provisional entry — research in progress

This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.

2138 XP — Inventory photo
Fig. 012138 XPInventory photo[1]

What it is

General reference — not yet source-verified

The KLA 2138 XP is a wafer defect inspection system used in semiconductor metrology and inspection.

How it works

General reference — not yet source-verified

A wafer defect inspection system scans wafer surfaces and detects defects by measuring how features or particles affect the optical signal returned from the wafer. Instruments in this class are used to find particulate contamination, pattern anomalies, and other surface or surface-related defects before those defects propagate to later process steps.

Where it fits in the process flow

General reference — not yet source-verified

This class of equipment is placed in the inspection and metrology part of semiconductor manufacturing, where wafers are checked between process operations to verify surface condition and identify defects early. It typically supports yield control by screening wafers before further processing or release to subsequent fabrication steps.

Applications

General reference — not yet source-verified

The machine is used for wafer defect inspection in semiconductor manufacturing. In this class, common uses include finding particles, surface defects, and pattern-related anomalies on processed wafers.

What do the numbers mean?

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Where are the manuals?

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Not publicly documented

Field notes

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Frequently asked questions

What kind of equipment is the KLA 2138 XP?

It is a wafer defect inspection system used in semiconductor metrology and inspection.[1][2][3]

Not publicly documented

The following facts about the 2138 XP are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No specifications for the 2138 XP are on record.

    Answerable by: an OEM datasheet, a cleanroom equipment inventory, or an engineer who operated or installed it

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 2138 XP are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the 2138 XP are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the 2138 XP are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the 2138 XP are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

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Sources & citations

Sources (3)Every fact above is drawn from these public sources
  1. [1]Inventory photo
  2. [2]KLA Tencor 2138 XP | Conation Technologiesconationtech.comconationtech.com
  3. [3]KLA-Tencor 2138 XPwotol.comwotol.com
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Last updated Jul 29, 2026.

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