Comparison ledger
KLA 2139 UI Brightfield Patterned Surface Defect, KLA AIT II Defect, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | ||
|---|---|---|
| OEM | KLA | KLA |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 2139 | KLA AIT |
| Specifications | ||
| Configuration | Ultra-Broadband Illumination[1] | — |
| Model | 2139 UI Brightfield Patterned Surface Defect[2] | — |
| OEM | KLA[2] | — |
| Category | Metrology & Inspection[1] | — |
| Wafer size | 8 inch[1] | — |
| Software Version | — | 5.3.20.4[3] |
| CIM | — | SECS, GEM[3] |
| Handler System | — | Dual[3] |
| Factory Interface | — | Open Cassette[3] |
| Wafer Size | — | 8 inch[3] |
Plan your fab
Building a Metrology & Inspection process? Get a complete equipment list.
Open the fab equipment planner →