Waferpedia

Comparison ledger

.498 PSL WaferversusGen-6

KLA .498 PSL Wafer, Sonoscan Gen-6, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
Gen-6Sonoscan
OEMKLASonoscan
CategoryMetrology & InspectionMetrology & Inspection
Wafer size—300mm
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation—new generation
FamilyKLA .498 PSL WaferSonoscan Gen-6
Specifications
ConfigurationNIST Traceable[1]—
NIST traceabilityYes[1]—
Technology—PolyGate™ technology with Multi-Gate™ and Probing-Gate™ functions capable of single and multi-focus imaging[2]
Gates per channel—Up to 100 gates per channel[2]
Sampling rate—2 Gsps[2]
Scanner—Inertially Balanced Linear Motor Scanner[2]
Scan reference platform—Tower-mounted scan reference platform and sample fixture[2]
Scanning area—Open-access scanning area[2]
Scan capacity—Capable of scanning JEDEC trays or a 300mm wafer[2]
Temperature control—Water recirculation and optional inline temperature control[2]
Analysis software—SonoSimulator for simplified analysis of stacked die parts[2]
Data analysis—Digital Image Analysis (DIA) quantifies acoustic data and supports automatic accept/reject criteria[2]
Rescanning—Virtual Rescanning Mode (VRM) stores comprehensive data for complete analysis after the sample is no longer available[2]
Instrument type—C-mode Scanning Acoustic Microscope[2]
Wafer size capability—300mm wafer[2]
Control software operating system—Windows 7 Ultimate[2]
Scanner type—Inertially Balanced Linear Motor Scanner[2]
Cooling / fluid handling—Water recirculation and optional inline temperature control[2]
Software analysis tools—SonoSimulator, Digital Image Analysis (DIA), and Virtual Rescanning Mode (VRM)[2]
Optional imaging mode—Frequency Domain Imaging (FDI)[2]

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Sources (2)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]ncf.uic.eduncf.uic.edu