Waferpedia

Comparison ledger

5100 Overlay Measurement versus P 16 +

KLA 5100 Overlay Measurement and KLA P 16 +, side by side. Every value shown is drawn from its cited encyclopedia entry.

Side-by-side comparison of selected equipment models
Attribute
OEMKLAKLA
CategoryMetrology & InspectionMetrology & Inspection
Wafer size
Process node
Introduced
Production run
Lifecycle
Lifecycle milestones
Control system
Generation
FamilyKLA 5100KLA P 16 +
Specifications
OSVMS[1]
ConfigurationWindows NT / VAX software[1]2A, 20in Hg @ 1cfm[2]
Phase1 Phase[2]
Software(OS) version 7.31.05 [Build 5][2]

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Sources (2)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]inventory listing