Comparison ledger
KLA Altair 8900 Defect and KLA P-2, side by side. Every value shown is drawn from its cited encyclopedia entry.
| Attribute | P-2KLA | |
|---|---|---|
| OEM | KLA | KLA |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | 200mm |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA Altair 8900 Defect | KLA P-2 |
| Specifications | ||
| Configuration | For CMOS Image Sensor Applications[1] | — |
| Module | Two Main Devices and a Set of UPS[1] | — |
| Wires | 5, Phases: 3[1] | — |
| Max AIC | 10,000[1] | — |
| Volts AC | 208 V[1] | — |
| Amps | 25[1] | — |
| Freq | 50 / 60 Hz[1] | — |
| SCCR (A) | 5,000[1] | — |
| Model | — | P-2[2] |
| OEM | — | KLA Tencor[2] |
| Equipment type | — | Profilometer[2] |
| Sample table | — | 200 mm sample table with vacuum[3] |
| Measurement range | — | Measures steps from 100 Å to 300 µm[3] |
| Maximum sample thickness | — | 20 mm[3] |
| Minimum sample length | — | 25 mm[3] |
| Feature | — | 3D scan option[3] |
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