KLA

Altair 8900 Defect

Metrology & Inspection KLA Altair 8900 Defect family

Research Quality: 40% complete

Altair 8900 Defect — Inventory photo — Fig. 01Altair 8900 DefectInventory photo^[1]

What it is

General reference — not yet source-verified

Defect inspection systems are fab metrology tools used to find and classify surface or pattern anomalies on wafers. Defect inspection systems support process monitoring by checking wafers for particles, pattern excursions, and other yield-relevant defects after manufacturing steps.

Applications

General reference — not yet source-verified

Defect inspection systems are used to support yield learning, excursion monitoring, and process control in semiconductor wafer production. Defect inspection systems are applied where manufacturers need to detect unwanted particles, pattern defects, and other physical irregularities that can affect device performance.

What do the numbers mean?

Power & electrical3

Volts AC: 208 V^[1]
Amps: 25^[1]
Freq: 50 / 60 Hz^[1]

Wafer handling1

Wafer size: 8 inch^[1]

Configuration & options13

For CMOS Image Sensor Applications^[1]
Module: Two Main Devices and a Set of UPS^[1]; Power:^[1]
Wires: 5, Phases: 3^[1]
Max AIC: 10,000^[1]
SCCR (A): 5,000^[1]
Wires: 5^[1]
Phases: 3^[1]
Manufacturer: KLA^[1]
Model: Altair 8900^[1]
Tool type: Defect inspection system^[1]
Application: CMOS image sensor applications^[1]
Vintage: 2014^[1]

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What does it need to run?

Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.

Volts AC208 V^[1]
Amps25^[1]
Freq50 / 60 Hz^[1]

Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

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Frequently asked questions

What wafer size does the KLA Altair 8900 support?

The Altair 8900 supports 8-inch (200 mm) wafers.^[1]^[2]

What does the module configuration of the Altair 8900 include?

The module includes two main devices and a set of uninterruptible power supplies (UPS).^[1]^[2]

Not publicly documented

The following facts about the Altair 8900 Defect are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Altair 8900 Defect are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the Altair 8900 Defect are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Altair 8900 Defect are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Altair 8900 Defect are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Altair 8900 Defect is not on record.
Answerable by: an OEM datasheet or a fab qualification report