Waferpedia

Comparison ledger

Altair 8920 i Patterned Wafer Particle Defect versus UV 1280 SE Thin Film Thickness Measurement

KLA Altair 8920 i Patterned Wafer Particle Defect and KLA UV 1280 SE Thin Film Thickness Measurement, side by side. Every value shown is drawn from its cited encyclopedia entry.

LinkedIn X Email
Side-by-side comparison of selected equipment models
Attribute
Altair 8920 i Patterned Wafer Particle DefectKLA
UV 1280 SE Thin Film Thickness MeasurementKLA
OEMKLAKLA
CategoryMetrology & InspectionMetrology & Inspection
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyKLA Altair 8920KLA UV 1280 SE Thin Film Thickness Measurement
Specifications
Voltage208 VAC[1]200 V[2]
Configuration50/60 Hz[1]Single phase[2]
Phase3 Phase[1]—
Power—1.8 kW[2]
Altair 8920 i Patterned Wafer Particle Defect entryUV 1280 SE Thin Film Thickness Measurement entry

Plan your fab

Building a Metrology & Inspection process? Get a complete equipment list.

Open the fab equipment planner →
Sources (2)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]inventory listing