Waferpedia

Comparison ledger

Archer XT+ Overlay Measurement versus FLX 2320

KLA Archer XT+ Overlay Measurement and KLA FLX 2320, side by side. Every value shown is drawn from its cited encyclopedia entry.

Side-by-side comparison of selected equipment models
Attribute
OEMKLAKLA
CategoryMetrology & InspectionMetrology & Inspection
Wafer size
Process node
Introduced
Production run
Lifecycle
Lifecycle milestones
Control system
Generation
FamilyKLA ArcherKLA FLX 2320
Specifications
Software version5.60[1]
ConfigurationNew / Refurbished Items:[1]Refurbished[2]
New system consumable partsShutter, HLS Lamp & Air Filters[1]
Dual Wavelength Scanning670 nm, 785 nm[2]
Software Version4.4[2]
Operation ManualDigital Copy[2]

Plan your fab

Building a Metrology & Inspection process? Get a complete equipment list.

Open the fab equipment planner →
Sources (2)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]inventory listing