Waferpedia

Comparison ledger

ICOS CI 9450 versus Surfscan AIT 8010 Particle Defect

KLA ICOS CI 9450 and KLA Surfscan AIT 8010 Particle Defect, side by side. Every value shown is drawn from its cited encyclopedia entry.

Side-by-side comparison of selected equipment models
Attribute
OEMKLAKLA
CategoryMetrology & InspectionMetrology & Inspection
Wafer size
Process node
Introduced
Production run
Lifecycle
Lifecycle milestones
Control system
Generation
FamilyKLA ICOSKLA Surfscan
Specifications
Configuration9x50[1]Hz 50-60[2]
Software version3.3.2.813[2]
CIMSECS, GEM[2]
Volts200-240[2]
Amps30[2]
Phase1[2]

Plan your fab

Building a Metrology & Inspection process? Get a complete equipment list.

Open the fab equipment planner →
Sources (2)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]inventory listing