Waferpedia

Comparison ledger

P 10 versus Surfscan AIT 8010 Particle Defect

KLA P 10 and KLA Surfscan AIT 8010 Particle Defect, side by side. Every value shown is drawn from its cited encyclopedia entry.

Side-by-side comparison of selected equipment models
Attribute
P 10KLA
OEMKLAKLA
CategoryMetrology & InspectionMetrology & Inspection
Wafer size
Process node
Introduced
Production run
Lifecycle
Lifecycle milestones
Control system
Generation
FamilyKLA PKLA Surfscan
Specifications
Phase1 Phase[1]1[2]
Frequency50 Hz[1]
Configuration2A[1]Hz 50-60[2]
Voltage220V[1]
Software version3.3.2.813[2]
CIMSECS, GEM[2]
Volts200-240[2]
Amps30[2]

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Sources (2)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]inventory listing