Comparison ledger
KLA P 16 + Profiler and KLA UV 1280 SE Thin Film Thickness Measurement, side by side. Every value shown is drawn from its cited encyclopedia entry.
| Attribute | ||
|---|---|---|
| OEM | KLA | KLA |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA P | KLA UV 1280 SE Thin Film Thickness Measurement |
| Specifications | ||
| Configuration | Refurbished[1] | Single phase[2] |
| Option | Stress, 3D. GEM / SECS[1] | — |
| Stage | Fully Motorized X-Y,Z, Theta, Level Stage[1] | — |
| Stylus | 2 um / 60D[1] | — |
| OS | Windows XP[1] | — |
| Software | Profiler V 7.35[1] | — |
| Vertical Range | 327 um[1] | — |
| Voltage | — | 200 V[2] |
| Power | — | 1.8 kW[2] |
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