Waferpedia

Comparison ledger

P-20H versus P/N: 0023889-00 Wafer Vacuum Chuck

KLA P-20H and KLA P/N: 0023889-00 Wafer Vacuum Chuck, side by side. Every value shown is drawn from its cited encyclopedia entry.

Side-by-side comparison of selected equipment models
Attribute
OEMKLAKLA
CategoryMetrology & InspectionMetrology & Inspection
Wafer size150mm
Process node
Introduced
Production run
LifecycleLegacy
Lifecycle milestones
Control system
Generation
FamilyKLA P-20HKLA P/N: 0023889-00 Wafer Vacuum Chuck
Specifications
Tool typeStylus profilometer[1]
Stylus tip radius2 µm[1]
Stylus cone angle60°[1]
Vertical range325 µm[1]
Sensor elementCapacitive sensor element[1]
Motion stagePrecision motion stage[1]
Vertical resolutionRoughly nm scale[1]
Stage movement8 inch[1]
Serial number09940111[1]
Tool ownerJoseph Jacob[1]
Access modeWalk-up tool (no reservation needed)[1]
ConfigurationCompatible with KLA SP1 Classic // SP1-TBi //SP1-DLS[2]
Wafer size150mm / 200mm Wafer Vacuum Chuck[2]

Plan your fab

Building a Metrology & Inspection process? Get a complete equipment list.

Open the fab equipment planner →
Sources (2)Every fact above is drawn from these public sources
  1. [1]nanofab.utah.edunanofab.utah.edu
  2. [2]inventory listing