Waferpedia

KLA

P-20H

LegacyMetrology & InspectionKLA P-20H family
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KLAP-20H
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  • Plate 01Tencor P20H Step Height Measurement #38497

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  • Plate 02Tencor P20H Long Scan Profiler

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  • Plate 03Tencor P20H Profiler #38497

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Performance

Precision motion stage[1]

Optics

Roughly nm scale[1]

What is it?

The P-20H is described as a stylus profilometer with a sharp 2 µm tip radius stylus that scans a sample on a precision translation stage. The source states it is commonly used for thin-film thickness measurements across a patterned step, wafer bow for film stress analysis, quantitative surface roughness over large areas, and 3-D surface imaging.

What can it run?

Process applications and technology nodes documented for this tool.

  • Measuring thin-film thickness across a patterned step
  • Wafer bow for film stress analysis
  • Quantitative surface roughness measurements
  • 3-D surface imaging
  • Line scans
  • Area scans

What do the numbers mean?

Optics & imaging1

Vertical resolution
Roughly nm scale[1]
Accurate?

Performance1

Motion stage
Precision motion stage[1]
Accurate?

Configuration & options9

Tool type
Stylus profilometer[1]
Accurate?
Stylus tip radius
2 µm[1]
Accurate?
Stylus cone angle
60°[1]
Accurate?
Vertical range
325 µm[1]
Accurate?
Sensor element
Capacitive sensor element[1]
Accurate?
Stage movement
8 inch[1]
Accurate?
Serial number
09940111[1]
Accurate?
Tool owner
Joseph Jacob[1]
Accurate?
Access mode
Walk-up tool (no reservation needed)[1]
Accurate?
Interested in this tool?
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Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

No research found yet — worked with this tool? Share what you know.

Not publicly documented

The following facts about the P-20H are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the P-20H are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the P-20H are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the P-20H are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the P-20H are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the P-20H is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

No research found yet — worked with this tool? Share what you know.

Sources & citations

Sources (3)Every fact above is drawn from these public sources
  1. [1]nanofab.utah.edunanofab.utah.edunanofab.utah.edu
  2. [2]Equipment Page | Utah Nanofabnanofab.utah.edunanofab.utah.edu
  3. [3]Request Equipment Training or Service | Utah Nanofabnanofab.utah.edunanofab.utah.edu
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Last updated Jul 29, 2026.

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