Waferpedia

Comparison ledger

P-20H versus RS 75 Resistivity Mapper

KLA P-20H and KLA RS 75 Resistivity Mapper, side by side. Every value shown is drawn from its cited encyclopedia entry.

Side-by-side comparison of selected equipment models
Attribute
OEMKLAKLA
CategoryMetrology & InspectionMetrology & Inspection
Wafer size
Process node
Introduced
Production run
LifecycleLegacy
Lifecycle milestones
Control system
Generation
FamilyKLA P-20HKLA RS 75
Specifications
Tool typeStylus profilometer[1]
Stylus tip radius2 µm[1]
Stylus cone angle60°[1]
Vertical range325 µm[1]
Sensor elementCapacitive sensor element[1]
Motion stagePrecision motion stage[1]
Vertical resolutionRoughly nm scale[1]
Stage movement8 inch[1]
Serial number09940111[1]
Tool ownerJoseph Jacob[1]
Access modeWalk-up tool (no reservation needed)[1]
Configuration220 Volts[2]
Voltage120 V[3]

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Sources (4)Every fact above is drawn from these public sources
  1. [1]nanofab.utah.edunanofab.utah.edu
  2. [2]inventory listing
  3. [3]inventory listing
  4. [4]inventory listing