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Surfscan SP 1 TBI versus UV 1280 SE Thin Film Thickness Measurement

KLA Surfscan SP 1 TBI and KLA UV 1280 SE Thin Film Thickness Measurement, side by side. Every value shown is drawn from its cited encyclopedia entry.

Side-by-side comparison of selected equipment models
Attribute
OEMKLAKLA
CategoryMetrology & InspectionMetrology & Inspection
Wafer size・When loading with FixLoad, the handler reaches maximum speed, causing wafer misalignment due to recoil
Process node
Introduced
Production run
Lifecycle
Lifecycle milestones
Control system
Generation
FamilyKLA SurfscanKLA UV 1280 SE Thin Film Thickness Measurement
Specifications
Phase208-240 V, Single phase[1]
Configuration50/60 Hz[1]Single phase[2]
Full Load Amps24 A[1]
Machine Main Breaker Rating30 A[1]
Ampere Rating of Largest Load12 A[1]
Bright Field (DIC) Option, P/N515990[1]
XY Coordination, P/N0082158-000[1]
Bright Field Sizing, P/N0082158-000[1]
Haze Normalization, Haze Analysis, P/N0081928-000[1]
SEC-1, P/N0021643-000[1]
HSMS, P/N528080[1]
PC-NFS Cient, P/N556025[1]
Desktop PC Software Option, P/N528170[1]
Wafer size・When loading with FixLoad, the handler reaches maximum speed, causing wafer misalignment due to recoil[1]
Voltage200 V[2]
Power1.8 kW[2]

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Sources (2)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]inventory listing