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Comparison ledger

DM8000 versus MZ75

Leica DM8000 and Leica MZ75, side by side. Every value shown is drawn from its cited encyclopedia entry.

Side-by-side comparison of selected equipment models
Attribute
DM8000Leica
MZ75Leica
OEMLeicaLeica
CategoryMetrology & InspectionMetrology & Inspection
Wafer size
Process node
Introduced
Production run
Lifecycle
Lifecycle milestones
Control system
Generation
FamilyLeica DM8000Leica MZ75
Specifications
DescriptionNew generation optical inspection system with digital camera[1]
Imaging modesBright Field (BF), Dark Field (DF), and Differential Interference Contrast (DIC)[1]
ControlsControls by GUI[1]
SoftwareLeica LAS X[1]
FunctionsMeasurements, overlay annotations, and saving as projects[1]
Objective setting mentionedSelect objective No. 1 (5x)[1]
Optical systemLeica HC optics (optical system corrected to infinity)[2]
Viewing tubeTrinocular Ergotube with upright and unreversed image; beam splitting 100/0 and 0/100 (eyepiece/camera)[2]
Macro imaging field of viewUp to 40 mm scan field on sample[2]
IlluminationFull LED incident light illumination; viewing techniques: Brightfield, darkfield, DIC, qualitative POL, oblique illumination, UV, OUV. Also full LED transmitted light illumination; BF, POL.[2]
Objective nosepieceMotorized, 6-position for BD objectives with M32 thread, absolutely encoded[3]
Stage (manual)8-inch manual inspection stage; travel range 202 mm × 202 mm in reflected and transmitted light; integrated rapid adjustment[2]
Stage (motorized)8-inch scanning stage; travel range 200 mm × 200 mm in reflected and transmitted light; 4 mm pitch spindle; max speed 240 mm/s[3]
FocusManual: heavy-duty 2-stage, coarse and fine, 35 mm travel range, height-adjustable knobs. Motorized: 2-stage with 35 mm travel range, high reproducibility, parfocality compensation.[2]
Weight (fully equipped)Approx. 41 kg (microscope approx. 36.1 kg)[2]
Power supply100–120/220–240 V AC, 50/60 Hz[2]
Ambient temperature range15–35 °C (without IR illumination); 15–28 °C (with IR illumination)[3]
Relative humidityMax. 80% at temperatures up to 33 °C (without condensation)[2]
ModelLeica MZ75[4]
CategoryInspection Microscope without Camera[4]
LocationZ07[4]
OptionAlignment microscope[4]

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Sources (4)Every fact above is drawn from these public sources
  1. [1]epfl.chepfl.ch
  2. [2]downloads.leica-microsystems.comdownloads.leica-microsystems.com
  3. [3]opti-tech.caopti-tech.ca
  4. [4]epfl.chepfl.ch