Comparison ledger
LTX-Credence D 10, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | D 10LTX-Credence | |
|---|---|---|
| OEM | LTX-Credence | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | LTX-Credence D 10 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | Software vs. 2.1.1.4[1] | — |
| Software Version | 2.1.1.4[1] | — |
| Workstation | SuperMicro Workstation[2] | — |
| Module - DPIN 96 16 M | DPIN 96 16 M (quantity 5)[2] | — |
| Module - DPIN 96 32 M | DPIN 96 32 M[2] | — |
| Module - DPS 16 | DPS 16[2] | — |
| Module - DIBU | DIBU[2] | — |
| Make | LTX / Credence[1] | — |
| Model | D 10[2] | JR-A-F4T[3] |
| Asset # | 82046[2] | — |
| Included items | SuperMicro Workstation; DPIN 96 16 M (5); DPIN 96 32 M; DPS 16; DIBU[2] | — |
| Software / modules | DPIN 96 16 M (5); DPIN 96 32 M; DPS 16; DIBU[2] | — |
| Chamber Size | — | 1.2 cubic feet[3] |
| Temperature Range | — | -68°C to +180°C[3] |
| Control | — | +/-1.0°C[3] |
| Manufacturer | — | Tenney[3] |
| Short description | — | Junior compact temperature test chambers[3] |
| Control accuracy | — | +/-1.0°C[3] |
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