LTX-Credence

The LTX / Credence D 10 is an automated test equipment system used in semiconductor manufacturing for testing integrated circuits.[1][2]
The D 10 tester operates by providing programmed electrical signals to the device under test (DUT) and comparing the device's output signals against expected values.
In the semiconductor manufacturing flow, the D 10 is used in the test and probe stage, after wafer fabrication and before final packaging and shipment.
The tester is used for final test of packaged devices as well as for wafer-level sort (probe), where it checks each die on a wafer before they are singulated.
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The following facts about the D 10 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the D 10 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the D 10 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the D 10 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the D 10 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the D 10 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Aug 20, 2026.