Comparison ledger
LTX-Credence Personal Kalos II, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Personal Kalos IILTX-Credence | |
|---|---|---|
| OEM | LTX-Credence | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | LTX-Credence Personal Kalos II | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | One Main Board included[1] | — |
| PN | 672-6199-xx *1 K2 288M DPS2 Main Board[1] | — |
| Category | Test & Probe[2] | — |
| One Main Board included | 1 main board included[1] | — |
| Pins/channels per Main Board | 96[1] | — |
| Maximum pins/channels | 192[1] | — |
| Main Board part number | PN: 672-6199-xx *1 K2 288M DPS2 Main Board[1] | — |
| Control software | Windows NT or XP user interface[2] | — |
| Interface card | Without system monitor RS232 interface card[2] | — |
| Chamber Size | — | 1.2 cubic feet[3] |
| Temperature Range | — | -68°C to +180°C[3] |
| Control | — | +/-1.0°C[3] |
| Manufacturer | — | Tenney[3] |
| Model | — | JR-A-F4T[3] |
| Short description | — | Junior compact temperature test chambers[3] |
| Control accuracy | — | +/-1.0°C[3] |
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