Personal Kalos II

The LTX-Credence Personal Kalos II is a test and probe system. Test and probe equipment makes electrical contact with semiconductor devices so their responses can be measured against programmed conditions and limits. Test and probe tools are used to evaluate device functionality and electrical behavior during manufacturing and engineering workflows.

Test and probe systems apply controlled electrical stimuli to a device under test and measure the resulting signals. Test and probe systems typically combine instrument resources, switching, control software, and an interface path to the device under test. Probe-oriented configurations connect at wafer level through probe hardware, while handler-oriented configurations connect to packaged parts through contactors or sockets.

Test and probe equipment sits in the electrical verification part of semiconductor manufacturing rather than in the material deposition, patterning, or etch parts of the line. Test and probe tools are used after earlier fabrication and assembly steps have created devices that can be contacted electrically. Test and probe results are used for screening, characterization, yield learning, and disposition decisions for lots or individual parts.

Test and probe equipment can be used in wafer-level probing workflows or in packaged-device test workflows, depending on the interface hardware and manufacturing sequence. Test and probe outputs typically feed downstream quality control, binning, failure analysis, and process improvement activities.

Test and probe systems are used for electrical evaluation of semiconductor devices. Test and probe systems produce measurement data, pass or fail outcomes, and diagnostic information that support troubleshooting and process control. Test and probe systems are used in manufacturing, engineering characterization, and fault isolation contexts.