Comparison ledger
LTX-Credence X-Series LX 20 ATE, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | X-Series LX 20 ATELTX-Credence | |
|---|---|---|
| OEM | LTX-Credence | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | LTX-Credence X-Series | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | With Docking and Manipulator from Turbodynamics[1] | — |
| Slot 1 | Instrument: SSBA[1] | — |
| Slot 2 | Instrument: OVI[1] | — |
| Slot 3 | instrument: Empty[1] | — |
| Slot 4 | Instrument: DCTM[1] | — |
| Slot 5 | Instrument: Empty[1] | — |
| Slot 6 | Instrument: Empty[1] | — |
| Slot 7 | Instrument: QFVI[1] | — |
| Slot 8 | Instrument: HEXVI 16[1] | — |
| Slot 9 | Instrument: AWG_HR[1] | — |
| Slot 10 | Instrument: Empty[1] | — |
| Slot 11 | Instrument: QFVI[1] | — |
| Slot 12 | Instrument: Empty[1] | — |
| Slot 13 | Instrument: Empty[1] | — |
| Slot 14 | Instrument: Empty[1] | — |
| Slot 15 | Instrument: FX 1_PEC[1] | — |
| Slot 16 | Instrument: FX 1_PEC[1] | — |
| Slot 17 | Instrument: FX_TMBD[1] | — |
| Slot 18 | Instrument: FX 1_PEC[1] | — |
| Slot 19 | Instrument: FX 1_PEC[1] | — |
| OEM | LTX / Credence[1] | — |
| Model | X-Series LX 20[1] | JR-A-F4T[2] |
| Equipment type | Automatic Test Equipment (ATE)[1] | — |
| Slot 20 | Instrument: Empty[1] | — |
| Slot 21 | Instrument: Empty[1] | — |
| Chamber Size | — | 1.2 cubic feet[2] |
| Temperature Range | — | -68°C to +180°C[2] |
| Control | — | +/-1.0°C[2] |
| Manufacturer | — | Tenney[2] |
| Short description | — | Junior compact temperature test chambers[2] |
| Control accuracy | — | +/-1.0°C[2] |
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