Comparison ledger
MPI TS 3500 Automatic Wafer, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | ||
|---|---|---|
| OEM | MPI | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | Wafer ID Reader | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | MPI TS 3500 Automatic Wafer | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Cited variants | — | |
| Specifications | ||
| Software | Sentio[2] | — |
| AST | RC-300 T-SA[3] | — |
| TS 3500 Series replaces PN | RC 300 T[3] | — |
| Wafer size | Wafer ID Reader[2] | — |
| Manufacturer | MPI[2] | Tenney[5] |
| Category | Test & Probe[2] | — |
| Automation | 300 mm fully automated probe station[1] | — |
| Supported wafer sizes | 150, 200, or 300 mm[4] | — |
| Wafer ID-Reader | Option for top or bottom ID reading[4] | — |
| Wafer pre-aligner | Included[4] | — |
| Cassette scanner | Included[4] | — |
| Chamber Size | — | 1.2 cubic feet[5] |
| Temperature Range | — | -68°C to +180°C[5] |
| Control | — | +/-1.0°C[5] |
| Model | — | JR-A-F4T[5] |
| Short description | — | Junior compact temperature test chambers[5] |
| Control accuracy | — | +/-1.0°C[5] |
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