Comparison ledger
Nikon NSR 2205 i 12 D, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | NSR 2205 i 12 DNikon | |
|---|---|---|
| OEM | Nikon | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Nikon NSR 2205 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Software Version | MCSV 2.41, OCSV 2.41[1] | — |
| CIM | SECS[1] | — |
| Handler System | WL Type 3[1] | — |
| Factory interface | Open Cassette[1] | — |
| Factory Interface | Open Cassette (2)[2] | — |
| Configuration | Vax Station, Pin Chuck[2] | — |
| Manufacturer | Nikon[1] | Tenney[4] |
| Model | NSR 2205 i 12 D[1] | JR-A-F4T[4] |
| Wafer Size | 8 inch[1] | — |
| CIM Interface | SECS[1] | — |
| Make | Nikon[1] | — |
| Wafer Sizes | 6 inch / 8 inch[1] | — |
| Additional Features | Vax Station, Pin Chuck[2] | — |
| Factory Interface Accessories | Vax Station, Pin Chuck[2] | — |
| Chamber Size | — | 1.2 cubic feet[4] |
| Temperature Range | — | -68°C to +180°C[4] |
| Control | — | +/-1.0°C[4] |
| Short description | — | Junior compact temperature test chambers[4] |
| Control accuracy | — | +/-1.0°C[4] |
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