Comparison ledger
Olympus scope1 and Olympus scope2, side by side. Every value shown is drawn from its cited encyclopedia entry.
| Attribute | scope1Olympus | scope2Olympus |
|---|---|---|
| OEM | Olympus | Olympus |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Olympus scope1 | Olympus scope2 |
| Specifications | ||
| Vendor | Olympus[1] | Olympus[2] |
| Model | MX61A[1] | MX-61[2] |
| Purpose | Semiconductor microscope for sample inspection and documentation[1] | Semiconductor microscope for sample inspection and documentation[2] |
| Observation methods | Brightfield and darkfield[1] | Brightfield and darkfield[2] |
| Objectives | 5x, 20x, 50x, 100x, and 150x objectives on motorized turret[1] | 5x, 10x, 20x, 50x, and 100x objectives on motorized turret[2] |
| Stage focus | Motorized stage focus[1] | Manual stage focus[2] |
| Digital imaging | Steam Motion software for calibrated measurements[1] | — |
| Digital imaging software | — | Steam Motion software for calibrated measurements[2] |
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