Comparison ledger
Seiko Epson NS 8080, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | NS 8080Seiko Epson | |
|---|---|---|
| OEM | Seiko Epson | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Seiko Epson NS 8080 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | Up to 8 sites testing capability[1] | — |
| Make | Seiko / Epson[1] | — |
| Model | NS 8080[1] | JR-A-F4T[3] |
| Machine type | Handler[1] | — |
| Category | Test & Probe[2] | — |
| Testing capability | Up to 8 sites[1] | — |
| Testing area | 264 mm x 149 mm[1] | — |
| Contact force | Up to 240 kgf[1] | — |
| UPH | Up to 13,500 ambient; up to 8,200 high temperature[1] | — |
| Vintage | 2010[1] | — |
| Chamber Size | — | 1.2 cubic feet[3] |
| Temperature Range | — | -68°C to +180°C[3] |
| Control | — | +/-1.0°C[3] |
| Manufacturer | — | Tenney[3] |
| Short description | — | Junior compact temperature test chambers[3] |
| Control accuracy | — | +/-1.0°C[3] |
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