Seiko Epson
NS 8080
The NS 8080 is a test handler from Seiko Epson. The NS 8080 has up to 8 sites testing capability. The NS 8080 has a testing area of 264 mm x 149 mm.[1][2]
What it is
General reference — not yet source-verifiedA semiconductor handler is equipment used in test and probe operations to move devices and present them to the electrical test interface. A handler belongs to the back-end test area rather than wafer fabrication patterning or deposition equipment.
How it works
The Seiko Epson NS 8080 has up to 8 sites testing capability. The Seiko Epson NS 8080 has a testing area of 264 mm x 149 mm. The Seiko Epson NS 8080 supports contact force up to 240 kgf. The Seiko Epson NS 8080 has throughput up to 13,500 UPH in ambient conditions and up to 8,200 UPH at high temperature.[1][2]
Where it fits in the process flow
General reference — not yet source-verifiedHandlers are used in semiconductor test flow after devices have been prepared for electrical evaluation and before final binning or downstream packing steps. Handlers support test and probe operations by automating movement and presentation of parts to the measurement interface.
Applications
The Seiko Epson NS 8080 is used for semiconductor test and probe work.[2]
What do the numbers mean?
Wafer handling1
Configuration & options13
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
Not publicly documented
The following facts about the NS 8080 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the NS 8080 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the NS 8080 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the NS 8080 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the NS 8080 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the NS 8080 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (2)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]waferpedia.com — waferpedia.comwaferpedia.com
Last updated Oct 15, 2026.
Compare with similar tools
View all →The Tenney TPS JR-A-F4T is a junior compact temperature test chamber with a 1.2 cubic foot chamber size and a temperature range of -68°C to +180°C.
The Rorze 03 RR 8120-001-001 is a wafer exchanger for 8-inch wafers.
The KLA 1007 is a wafer prober manufactured by KLA.