Comparison ledger
Signatone TH-760, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | TH-760Signatone | |
|---|---|---|
| OEM | Signatone | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Signatone TH-760 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Machine type | test head probe station[1] | — |
| Base structure | constructed around a vibration isolation table[1] | — |
| Probe station arrangement | the test head is docked beneath a large plate that floats on a cushion of compressed N2 or C.D.A.[1] | — |
| Access feature | a hole is milled into the plate to provide for probing into the device[1] | — |
| Support platen | a micropositioner support platen is mounted on top of the plate[1] | — |
| Mobility | the system has wheels so that it can be positioned above the test head[1] | — |
| Options | CAP (Computer Aided Probing), lasers, manual or motorized micropositioners, active probes[1] | — |
| Designed for | probing devices mounted directly in a test head[2] | — |
| Probe access | a hole is milled into the plate to provide access for probing into the device[3] | — |
| Chamber Size | — | 1.2 cubic feet[4] |
| Temperature Range | — | -68°C to +180°C[4] |
| Control | — | +/-1.0°C[4] |
| Manufacturer | — | Tenney[4] |
| Model | — | JR-A-F4T[4] |
| Short description | — | Junior compact temperature test chambers[4] |
| Control accuracy | — | +/-1.0°C[4] |
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