Comparison ledger
Signatone WL-210, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | WL-210Signatone | |
|---|---|---|
| OEM | Signatone | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | up to 8-inch wafers | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Signatone WL-210 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Cited variants |
| — |
| Specifications | ||
| Base | Massive 2" one-piece machined aircraft aluminum base for stability[1] | — |
| Platen | Large heavy-duty nickel steel platen with 4 point planar lift[1] | — |
| Positioning stage | Fast, accurate and repeatable compound X-Y stage for sub-micron positioning[1] | — |
| Wafer/substrate compatibility | Accepts shards through 8" wafers, substrates, PCB's, and ultra-thin wafers[1] | — |
| Platen control | Independent platen height (locking) and contact / separate control[1] | — |
| Chuck and stage assembly | Non-ferrous chuck and stage assembly reduces magnetic interference and crosstalk[1] | — |
| Micropositioner support | Supports bolt-down, vacuum, and magnetic base micropositioners[1] | — |
| Chuck biasing | Banana / BNC / Triax chuck biasing[1] | — |
| Probe card holder | Quick-Change probe card holder option with independent theta adjust[1] | — |
| Microscope | Tilt-back microscope provides unobstructed fixturing access[1] | — |
| Type | RF / Microwave Probe Station[1] | — |
| Series | WaveLink Series[1] | — |
| Platen height control | Independent platen height (locking) and contact / separate control[1] | — |
| Microscope access | Tilt-back microscope provides unobstructed fixturing access[1] | — |
| Chuck XY stage travel range | 205 mm x 205 mm (8.07 x 8.07 in)[2] | — |
| Standard wafer chuck diameter | 203 mm[2] | — |
| Supported DUT sizes | 25mm, 75mm, 100mm, 150mm, 200mm[2] | — |
| RF applications | Up to 110GHz[2] | — |
| mmW range | 110GHz -1.5THz[2] | — |
| High power application | Up to 12KV /600A[2] | — |
| Temperature capability | Ambient, +300°C[2] | — |
| Quick-change probe card holder | Quick-Change probe card holder option with independent theta adjust[1] | — |
| Chamber Size | — | 1.2 cubic feet[3] |
| Temperature Range | — | -68°C to +180°C[3] |
| Control | — | +/-1.0°C[3] |
| Manufacturer | — | Tenney[3] |
| Model | — | JR-A-F4T[3] |
| Short description | — | Junior compact temperature test chambers[3] |
| Control accuracy | — | +/-1.0°C[3] |
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