Comparison ledger
SUSS MicroTec PA 300 ProbeShield Probing, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | PA 300 ProbeShield ProbingSUSS MicroTec | |
|---|---|---|
| OEM | SUSS MicroTec | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | SUSS MicroTec PA 300 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | Velox 2.2.3.23[1] | — |
| Chuck | 12-inch nickel plated aluminum chuck[2] | — |
| Control unit | ATT M300 Control Unit[2] | — |
| Microscope | Cascade CMPS-888 Microscope[2] | — |
| Micropositioners | Suss PH150 Micropositioner 3ea[1] | — |
| Optics | 10X,2X Mitutoyo Plan Apo Objective 2ea[2] | — |
| Failure mode | Error57 No Motor Power (possible defective Motion Drive Board)[2] | — |
| Chamber Size | — | 1.2 cubic feet[3] |
| Temperature Range | — | -68°C to +180°C[3] |
| Control | — | +/-1.0°C[3] |
| Manufacturer | — | Tenney[3] |
| Model | — | JR-A-F4T[3] |
| Short description | — | Junior compact temperature test chambers[3] |
| Control accuracy | — | +/-1.0°C[3] |
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