Comparison ledger
Tenney , TPS JR-A-F4T Junior compact temperature test chambers, Teradyne Nextest Magnum II EV Automated Memory, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | ||
|---|---|---|
| OEM | Tenney | Teradyne |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Tenney , TPS JR-A-F4T Junior compact temperature test chambers | Teradyne Nextest Magnum |
| Specifications | ||
| Chamber Size | 1.2 cubic feet[1] | — |
| Temperature Range | -68°C to +180°C[1] | — |
| Control | +/-1.0°C[1] | — |
| Manufacturer | Tenney[1] | — |
| Model | JR-A-F4T[1] | Magnum II EV[3] |
| Short description | Junior compact temperature test chambers[1] | — |
| Control accuracy | +/-1.0°C[1] | — |
| Workstation | — | Dell T3500[2] |
| Configuration | — | SAB 515004[3] |
| OEM | — | Teradyne / Nextest[3] |
| Equipment type | — | Automated memory tester[3] |
| Category | — | Test & Probe[2] |
| SAB | — | 515004[2] |
| IPC | — | 5.4.14[2] |
| Vintage | — | 2013[3] |
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