Teradyne
Nextest Magnum II EV Automated Memory
What it is
How it works
General reference — not yet source-verifiedAutomated memory testers apply programmed electrical patterns to a device under test and compare returned signals with pass-fail criteria. Automated memory testers typically coordinate instrument resources, test software, and device interface hardware to execute repeatable test sequences. Probe-capable test flows for this class of equipment can be used either with wafer contact hardware upstream of singulation or with packaged-device handling arrangements later in manufacturing.
Where it fits in the process flow
General reference — not yet source-verifiedTest and probe equipment is positioned after device fabrication steps create the electrical structures that must be verified. Probe-oriented use occurs before dicing and packaging when wafers are contacted for electrical evaluation. Test use also appears after packaging when finished memory parts are screened and functionally checked before downstream sorting or shipment to board-level assembly.
Applications
General reference — not yet source-verifiedAutomated memory testers are used for electrical verification of memory products and memory-related devices. Typical applications for this equipment class include functional test, failure screening, characterization, and production monitoring of semiconductor memory behavior.
Why won't it start?
Documented failure modes, common issues, and field considerations.
- PC not functional
- Errors during tests
- System diag fail on DPS pins
What do the numbers mean?
Control & software1
- PC not functional[2]
Configuration & options12
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
Not publicly documented
The following facts about the Nextest Magnum II EV Automated Memory are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Nextest Magnum II EV Automated Memory are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the Nextest Magnum II EV Automated Memory are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Nextest Magnum II EV Automated Memory are not on record.
Answerable by: an engineer who operated it or OEM installation records
The process node or technology generation of the Nextest Magnum II EV Automated Memory is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the Nextest Magnum II EV Automated Memory are on record.
Answerable by: an OEM parts catalog or a service engineer
Sources & citations
Sources (6)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]Inventory photo
- [3]Inventory photo
- [4]Inventory photo
- [5]waferpedia.com — waferpedia.comwaferpedia.com
- [6]Nextest Magnum II EV Automated Memory Alternatives — Similar Test & Probe Equipment | Waferpedia — waferpedia.comwaferpedia.com
Last updated Oct 17, 2026.
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