Comparison ledger
Tenney , TPS JR-A-F4T Junior compact temperature test chambers, Thermawave Opti-Probe 2600, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Opti-Probe 2600Thermawave | |
|---|---|---|
| OEM | Tenney | Thermawave |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Tenney , TPS JR-A-F4T Junior compact temperature test chambers | — |
| Cited variants | — | |
| Specifications | ||
| Chamber Size | 1.2 cubic feet[2] | — |
| Temperature Range | -68°C to +180°C[2] | — |
| Control | +/-1.0°C[2] | — |
| Manufacturer | Tenney[2] | — |
| Model | JR-A-F4T[2] | — |
| Short description | Junior compact temperature test chambers[2] | — |
| Control accuracy | +/-1.0°C[2] | — |
| Wafer Size Compatibility | — | 4- to 8-inches[3] |
| Laser | — | 675nm thermoelectrically cooled diode laser[3] |
| Spectrometry lamp | — | 450 to 840 nm tungsten halogen lamp[3] |
| BPR range | — | thick dielectric films > 500A[3] |
| BPE range | — | thin dielectric films < 500A[3] |
| Resolution | — | 150nm[3] |
| Product type | — | Thin Film Measurement System[4] |
| Version | — | 200[4] |
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