Comparison ledger
Tenney , TPS JR-A-F4T Junior compact temperature test chambers, Tokyo Electron P 8 Automatic Wafer, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | P 8 Automatic WaferTokyo Electron | |
|---|---|---|
| OEM | Tenney | Tokyo Electron |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | 1996 Vintage · 2002 Vintage |
| Control system | — | — |
| Generation | — | — |
| Family | Tenney , TPS JR-A-F4T Junior compact temperature test chambers | Tokyo Electron P 8 Automatic Wafer |
| Specifications | ||
| Chamber Size | 1.2 cubic feet[1] | — |
| Temperature Range | -68°C to +180°C[1] | — |
| Control | +/-1.0°C[1] | — |
| Manufacturer | Tenney[1] | Tokyo Electron[2] |
| Model | JR-A-F4T[1] | P 8[2] |
| Short description | Junior compact temperature test chambers[1] | — |
| Control accuracy | +/-1.0°C[1] | — |
| Type | — | Automatic wafer prober[2] |
| Make | — | Tel[2] |
| Wafer size | — | 6-inch and 8-inch wafers (150 mm / 200 mm)[3] |
| Wafer loading | — | Automatic with cassette-to-cassette handler[3] |
| Alignment system | — | Optical + mechanical alignment (microscope + camera)[3] |
| Chuck type | — | Ambient, hot chuck, triaxial (optional)[3] |
| ATE compatibility | — | Advantest, Teradyne, others[3] |
| Control system | — | TEL GUI / Loader controller[3] |
| Probe card support | — | Vertical, cantilever (custom fixtures available)[3] |
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